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Fast and quantitative 2D and 3D orientation mapping using Raman microscopy

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Fast and quantitative 2D and 3D orientation mapping using Raman microscopy. / Ilchenko, Oleksii; Pilgun, Yuriy; Kutsyk, Andrii; Slipets, Roman; Bachmann, Florian; Todeschini, Matteo; Okeyo, Peter Ouma; Friis Poulsen, Henning; Boisen, Anja.

I: Nature Communications, Bind 10, 5555, 05.12.2019.

Publikation: Bidrag til tidsskriftTidsskriftartikelForskningfagfællebedømt

Harvard

Ilchenko, O, Pilgun, Y, Kutsyk, A, Slipets, R, Bachmann, F, Todeschini, M, Okeyo, PO, Friis Poulsen, H & Boisen, A 2019, 'Fast and quantitative 2D and 3D orientation mapping using Raman microscopy', Nature Communications, bind 10, 5555. https://doi.org/10.1038/s41467-019-13504-8

APA

Ilchenko, O., Pilgun, Y., Kutsyk, A., Slipets, R., Bachmann, F., Todeschini, M., ... Boisen, A. (2019). Fast and quantitative 2D and 3D orientation mapping using Raman microscopy. Nature Communications, 10, [5555]. https://doi.org/10.1038/s41467-019-13504-8

Vancouver

Ilchenko O, Pilgun Y, Kutsyk A, Slipets R, Bachmann F, Todeschini M o.a. Fast and quantitative 2D and 3D orientation mapping using Raman microscopy. Nature Communications. 2019 dec 5;10. 5555. https://doi.org/10.1038/s41467-019-13504-8

Author

Ilchenko, Oleksii ; Pilgun, Yuriy ; Kutsyk, Andrii ; Slipets, Roman ; Bachmann, Florian ; Todeschini, Matteo ; Okeyo, Peter Ouma ; Friis Poulsen, Henning ; Boisen, Anja. / Fast and quantitative 2D and 3D orientation mapping using Raman microscopy. I: Nature Communications. 2019 ; Bind 10.

Bibtex

@article{a1eb9ae286b6402ab28f0c33ffbb8aa7,
title = "Fast and quantitative 2D and 3D orientation mapping using Raman microscopy",
abstract = "Non-destructive orientation mapping is an important characterization tool in materials science and geoscience for understanding and/or improving material properties based on their grain structure. Confocal Raman microscopy is a powerful non-destructive technique for chemical mapping of organic and inorganic materials. Here we demonstrate orientation mapping by means of Polarized Raman Microscopy (PRM). While the concept that PRM is sensitive to orientation changes is known, to our knowledge, an actual quantitative orientation mapping has never been presented before. Using a concept of ambiguity-free orientation determination analysis, we present fast and quantitative single-acquisition Raman-based orientation mapping by simultaneous registration of multiple Raman scattering spectra obtained at different polarizations. We demonstrate applications of this approach for two- and three-dimensional orientation mapping of a multigrain semiconductor, a pharmaceutical tablet formulation and a polycrystalline sapphire sample. This technique can potentially move traditional X-ray and electron diffraction type experiments into conventional optical laboratories.",
author = "Oleksii Ilchenko and Yuriy Pilgun and Andrii Kutsyk and Roman Slipets and Florian Bachmann and Matteo Todeschini and Okeyo, {Peter Ouma} and {Friis Poulsen}, Henning and Anja Boisen",
year = "2019",
month = "12",
day = "5",
doi = "10.1038/s41467-019-13504-8",
language = "English",
volume = "10",
journal = "Nature Communications",
issn = "2041-1723",
publisher = "nature publishing group",

}

RIS

TY - JOUR

T1 - Fast and quantitative 2D and 3D orientation mapping using Raman microscopy

AU - Ilchenko, Oleksii

AU - Pilgun, Yuriy

AU - Kutsyk, Andrii

AU - Slipets, Roman

AU - Bachmann, Florian

AU - Todeschini, Matteo

AU - Okeyo, Peter Ouma

AU - Friis Poulsen, Henning

AU - Boisen, Anja

PY - 2019/12/5

Y1 - 2019/12/5

N2 - Non-destructive orientation mapping is an important characterization tool in materials science and geoscience for understanding and/or improving material properties based on their grain structure. Confocal Raman microscopy is a powerful non-destructive technique for chemical mapping of organic and inorganic materials. Here we demonstrate orientation mapping by means of Polarized Raman Microscopy (PRM). While the concept that PRM is sensitive to orientation changes is known, to our knowledge, an actual quantitative orientation mapping has never been presented before. Using a concept of ambiguity-free orientation determination analysis, we present fast and quantitative single-acquisition Raman-based orientation mapping by simultaneous registration of multiple Raman scattering spectra obtained at different polarizations. We demonstrate applications of this approach for two- and three-dimensional orientation mapping of a multigrain semiconductor, a pharmaceutical tablet formulation and a polycrystalline sapphire sample. This technique can potentially move traditional X-ray and electron diffraction type experiments into conventional optical laboratories.

AB - Non-destructive orientation mapping is an important characterization tool in materials science and geoscience for understanding and/or improving material properties based on their grain structure. Confocal Raman microscopy is a powerful non-destructive technique for chemical mapping of organic and inorganic materials. Here we demonstrate orientation mapping by means of Polarized Raman Microscopy (PRM). While the concept that PRM is sensitive to orientation changes is known, to our knowledge, an actual quantitative orientation mapping has never been presented before. Using a concept of ambiguity-free orientation determination analysis, we present fast and quantitative single-acquisition Raman-based orientation mapping by simultaneous registration of multiple Raman scattering spectra obtained at different polarizations. We demonstrate applications of this approach for two- and three-dimensional orientation mapping of a multigrain semiconductor, a pharmaceutical tablet formulation and a polycrystalline sapphire sample. This technique can potentially move traditional X-ray and electron diffraction type experiments into conventional optical laboratories.

U2 - 10.1038/s41467-019-13504-8

DO - 10.1038/s41467-019-13504-8

M3 - Journal article

C2 - 31804493

VL - 10

JO - Nature Communications

JF - Nature Communications

SN - 2041-1723

M1 - 5555

ER -

ID: 231509687